A spiking neural network achieves about 98% wafer-map defect classification accuracy on WM-811k, beating reported DNN baselines especially on rare defect patterns.
Wafer map failure pattern recognition and similarity ranking for large-scale datasets,
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Wafer2Spike: Spiking Neural Network for Wafer Map Pattern Classification
A spiking neural network achieves about 98% wafer-map defect classification accuracy on WM-811k, beating reported DNN baselines especially on rare defect patterns.