A novel optimization algorithm reconstructs 3D refractive index in reflection-mode microscopy by exploiting multiply-scattered waves from uncontrolled background structures, using weighted time loss, positivity constraints, and total variation regularization, validated on simulations.
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Taking advantage of multiple scattering for Optical Reflection Tomography
A novel optimization algorithm reconstructs 3D refractive index in reflection-mode microscopy by exploiting multiply-scattered waves from uncontrolled background structures, using weighted time loss, positivity constraints, and total variation regularization, validated on simulations.