Silica thin films show 6% out-of-plane elastic anisotropy removable by 900°C annealing, measured via Brillouin scattering and confirmed by IR reflectivity, with implications for thermal noise models.
Hosono, Fourier transform infrared attenuated total reflection spectra of ion-implanted silica glasses, Journal of Applied Physics 69, 8079 (1991)
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Elastic and structural anisotropy in silica thin films for gravitational-wave detectors
Silica thin films show 6% out-of-plane elastic anisotropy removable by 900°C annealing, measured via Brillouin scattering and confirmed by IR reflectivity, with implications for thermal noise models.