A deep-reinforcement-learning agent that dynamically tunes PI control gains reduced deflection errors by 26% to 90% on commercial scanning probe microscope scans.
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PICTS: A Novel Deep Reinforcement Learning Approach for Dynamic P-I Control in Scanning Probe Microscopy
A deep-reinforcement-learning agent that dynamically tunes PI control gains reduced deflection errors by 26% to 90% on commercial scanning probe microscope scans.