Demonstration of reliable electrical transport measurements on NbN devices at 8-9 K inside a TEM via cryo-holder with radiation shielding, enabling correlative studies.
D.et al.Direct visualization of defect- controlled diffusion in van der Waals gaps.Advanced Ma- terials36, 2403989 (2024)
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Towards reliable electrical measurements of superconducting devices inside a transmission electron microscope
Demonstration of reliable electrical transport measurements on NbN devices at 8-9 K inside a TEM via cryo-holder with radiation shielding, enabling correlative studies.