The cepstral method achieves 0.09% strain precision at 1 nm resolution on a small-pixel-count detector, with precision scaling proportional to convergence angle over the square root of dose.
The Bloch wave simulations were done using the EMAPS package (Zuo & Mabon, 2004)
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Cepstral Strain Mapping for Small Pixel-Count Detectors
The cepstral method achieves 0.09% strain precision at 1 nm resolution on a small-pixel-count detector, with precision scaling proportional to convergence angle over the square root of dose.