A multi-amplifier sensing CCD was read out with two new modes, reaching about 0.45 electrons of noise in a region of interest.
New advancements in charge-coupled device technology: subelectron noise and 4096 x 4096 pixel CCDs,
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Readout Optimization of Multi-Amplifier Sensing Charge-Coupled Devices for Single-Quantum Measurement
A multi-amplifier sensing CCD was read out with two new modes, reaching about 0.45 electrons of noise in a region of interest.