An error-resilient gate search scheme using multi-objective optimization and pulse symmetries enables microsecond two-qubit gates with fidelities approaching 99.9% in linear ion traps of up to 50 ions.
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Photodissociation at 225 nm recovers Ba+ ions from reactions with background gases, increasing Coulomb crystal lifetime from 6 hours to 2 days.
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Error-Resilient Fast Entangling Gates for Scalable Ion-Trap Quantum Processors
An error-resilient gate search scheme using multi-objective optimization and pulse symmetries enables microsecond two-qubit gates with fidelities approaching 99.9% in linear ion traps of up to 50 ions.
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Increase of barium ion-trap lifetime via photodissociation
Photodissociation at 225 nm recovers Ba+ ions from reactions with background gases, increasing Coulomb crystal lifetime from 6 hours to 2 days.