Mask-conditioned LDM generates synthetic TEM defect image-mask pairs that augment small experimental sets and produce up to 0.02 gain in harmonic-mean F1 for combined detection and classification with Mask R-CNN.
Evaluation of Human- Bias in Labeling of Ambiguous Features in Electron Microscopy Machine Learning Models.Microscopy and Microanalysis, 29(Supplement_1):1493–1494, 07 2023
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Improving Combined Detection and Classification of TEM Defects via Mask-Conditioned Latent Diffusion Augmentation
Mask-conditioned LDM generates synthetic TEM defect image-mask pairs that augment small experimental sets and produce up to 0.02 gain in harmonic-mean F1 for combined detection and classification with Mask R-CNN.