Edge-detected 4DSTEM acquires electron diffraction only at the thin edges of nanoparticles, cutting acquisition time and dose by tens of times while producing the same powder diffraction patterns.
Title resolution pending
1 Pith paper cite this work. Polarity classification is still indexing.
1
Pith paper citing it
fields
physics.app-ph 1years
2024 1verdicts
CONDITIONAL 1representative citing papers
citing papers explorer
-
Edge-Detected 4DSTEM -- effective low-dose diffraction data acquisition method for nanopowder samples in a SEM instrument
Edge-detected 4DSTEM acquires electron diffraction only at the thin edges of nanoparticles, cutting acquisition time and dose by tens of times while producing the same powder diffraction patterns.