Pan-sharpening is applied to cathodoluminescence microscopy to reduce electron-beam dose, enabling high-resolution spectral imaging of beam-sensitive 2D materials, demonstrated on hBN.
Turunen , author M
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Non-perturbative cathodoluminescence microscopy of beam-sensitive materials
Pan-sharpening is applied to cathodoluminescence microscopy to reduce electron-beam dose, enabling high-resolution spectral imaging of beam-sensitive 2D materials, demonstrated on hBN.