IAENet fuses 2D and 3D anomaly scores with a learned importance-aware weighting and a margin-based selector loss, achieving state-of-the-art point-level localization on MVTec 3D-AD.
G$^{2}$SF-MIAD: Geometry-Guided Score Fusion for Multimodal Industrial Anomaly Detection
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abstract
Industrial quality inspection plays a critical role in modern manufacturing by identifying defective products during production. While single-modality approaches using either 3D point clouds or 2D RGB images suffer from information incompleteness, multimodal anomaly detection offers promise through the complementary fusion of crossmodal data. However, existing methods face challenges in effectively integrating unimodal results and improving discriminative power. To address these limitations, we first reinterpret memory bank-based anomaly scores in single modalities as isotropic Euclidean distances in local feature spaces. Dynamically evolving from Euclidean metrics, we propose a novel \underline{G}eometry-\underline{G}uided \underline{S}core \underline{F}usion (G$^{2}$SF) framework that progressively learns an anisotropic local distance metric as a unified score for the fusion task. Through a geometric encoding operator, a novel Local Scale Prediction Network (LSPN) is proposed to predict direction-aware scaling factors that characterize first-order local feature distributions, thereby enhancing discrimination between normal and anomalous patterns. Additionally, we develop specialized loss functions and score aggregation strategy from geometric priors to ensure both metric generalization and efficacy. Comprehensive evaluations on the MVTec-3D AD and Eyecandies datasets demonstrate the state-of-the-art detection performance of our method, and detailed ablation analysis validates each component's contribution. Our code is available at https://github.com/ctaoaa/G2SF.
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IAENet: An Importance-Aware Ensemble Model for 3D Point Cloud-Based Anomaly Detection
IAENet fuses 2D and 3D anomaly scores with a learned importance-aware weighting and a margin-based selector loss, achieving state-of-the-art point-level localization on MVTec 3D-AD.