DEFT turns ATPG into differentiable optimization with a reparameterization and CUDA kernel, cutting test pattern counts by 27.3% on average versus commercial tools.
Defect modeling using fault tuples,
1 Pith paper cite this work. Polarity classification is still indexing.
1
Pith paper citing it
fields
cs.SE 1years
2025 1verdicts
UNVERDICTED 1representative citing papers
citing papers explorer
-
DEFT: Differentiable Automatic Test Pattern Generation
DEFT turns ATPG into differentiable optimization with a reparameterization and CUDA kernel, cutting test pattern counts by 27.3% on average versus commercial tools.