Develops and validates a model for small charge packet transport in high-resistivity CCDs using a new depth-dependent lateral spread measurement technique and an extended diffusion algorithm.
Plasma effect in silicon charge coupled devices (CCDs),
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Studies on small charge packet transport in high-resistivity fully-depleted CCDs
Develops and validates a model for small charge packet transport in high-resistivity CCDs using a new depth-dependent lateral spread measurement technique and an extended diffusion algorithm.