A two-wire LCR meter with in-situ parasitic background subtraction measures cryogenic component impedances and reveals large temperature-driven changes in MLCC capacitors and thick-film resistors.
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Correcting impedance measurements for background parasitics to characterize circuit components in cryogenic environments
A two-wire LCR meter with in-situ parasitic background subtraction measures cryogenic component impedances and reveals large temperature-driven changes in MLCC capacitors and thick-film resistors.