Optimal success probability for identifying one or two faulty unknown unitaries is independent of total device count, achieved via an ancillary-system protocol that allows independent testing.
Jamio lkowski, Reports on mathematical physics3, 275 (1972)
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Exact identification of unknown unitary processes
Optimal success probability for identifying one or two faulty unknown unitaries is independent of total device count, achieved via an ancillary-system protocol that allows independent testing.