A cryogenic widefield NV-diamond microscope images flux trapping in Nb films and patterned strips, revealing a crossover in vortex expulsion behavior between 10 and 20 μm widths that agrees with theory.
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Microscopic Usadel calculation of Bc1 for dirty superconducting thin-film strips yields a larger vortex self-energy than Pearl–London and no single width-independent cutoff.
Empirical scaling across materials reveals a universal bound on microwave dissipation tied to superfluid density and attributed to trapped nonequilibrium quasiparticles.
citing papers explorer
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Flux-trapping characterization for superconducting electronics using a cryogenic widefield N-$V$ diamond microscope
A cryogenic widefield NV-diamond microscope images flux trapping in Nb films and patterned strips, revealing a crossover in vortex expulsion behavior between 10 and 20 μm widths that agrees with theory.
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Microscopic theory of the lower critical field in superconducting thin-film strips
Microscopic Usadel calculation of Bc1 for dirty superconducting thin-film strips yields a larger vortex self-energy than Pearl–London and no single width-independent cutoff.
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Universal bound on microwave dissipation in superconducting circuits
Empirical scaling across materials reveals a universal bound on microwave dissipation tied to superfluid density and attributed to trapped nonequilibrium quasiparticles.