Twinning suppression via substrate step-edge alignment in thin SrIrO3 films on SrTiO3 allows observation of thickness-dependent electronic anisotropy up to twice the value in strain-free films.
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Suppression of twinning and enhanced electronic anisotropy of SrIrO3 films
Twinning suppression via substrate step-edge alignment in thin SrIrO3 films on SrTiO3 allows observation of thickness-dependent electronic anisotropy up to twice the value in strain-free films.