A cryogenic widefield NV-diamond microscope images flux trapping in Nb films and patterned strips, revealing a crossover in vortex expulsion behavior between 10 and 20 μm widths that agrees with theory.
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Systematic tests show high-aspect-ratio slit moats best sequester flux in shielded environments below 1 microtesla, yet vortices still pin at material defects so moats alone are insufficient.
citing papers explorer
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Flux-trapping characterization for superconducting electronics using a cryogenic widefield N-$V$ diamond microscope
A cryogenic widefield NV-diamond microscope images flux trapping in Nb films and patterned strips, revealing a crossover in vortex expulsion behavior between 10 and 20 μm widths that agrees with theory.
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Mitigation of Magnetic Flux Trapping in Superconducting Electronics Using Moats
Systematic tests show high-aspect-ratio slit moats best sequester flux in shielded environments below 1 microtesla, yet vortices still pin at material defects so moats alone are insufficient.