By fitting simulated muon stopping profiles to measured muonic X-ray depth profiles, the authors recover gold layer thicknesses of 3.5 to 11 micrometers on gilded copper alloys, matching scanning electron microscopy for most samples.
Towards nanometric resolution in multilayer depth profiling: A comparative study of RBS, SIMS, XPS and GDOES,
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Depth profiling the elemental composition with negative muons: Monte Carlo based tools for improved data analysis
By fitting simulated muon stopping profiles to measured muonic X-ray depth profiles, the authors recover gold layer thicknesses of 3.5 to 11 micrometers on gilded copper alloys, matching scanning electron microscopy for most samples.