Demonstrates first in-situ heterodyne KPFM in SEM with piezo-resistive cantilevers for simultaneous topography and contact potential difference mapping on 2D heterostructures and semiconductor circuits.
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In-situ correlative SEM/KPFM for semiconductor devices and 2D heterostructures
Demonstrates first in-situ heterodyne KPFM in SEM with piezo-resistive cantilevers for simultaneous topography and contact potential difference mapping on 2D heterostructures and semiconductor circuits.