A vacuum-sealed transmission XRR cell with cartridge heating and a simple vapor manifold enables controlled 0–250 mbar dosing and 25–200 °C measurements that resolve Å-scale film changes on a laboratory diffractometer.
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Enabling temperature controlled in-situ vapor dosing for lab source X-ray reflectivity measurements
A vacuum-sealed transmission XRR cell with cartridge heating and a simple vapor manifold enables controlled 0–250 mbar dosing and 25–200 °C measurements that resolve Å-scale film changes on a laboratory diffractometer.