A vanishing ninth Fourier peak in difference-of-Gaussians maps of raw STM images identifies the triple-step period of nominally Si(557) wafers as 18b = 5.99 nm, i.e. local Si(8 8 11) orientation.
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Period-dependent suppression of Fourier peaks for topography images: Analysis of periodicity of triple-step arrays on vicinal Si(h h m) surfaces
A vanishing ninth Fourier peak in difference-of-Gaussians maps of raw STM images identifies the triple-step period of nominally Si(557) wafers as 18b = 5.99 nm, i.e. local Si(8 8 11) orientation.