Electron escape probability in NEA photocathodes is read out directly from surface-photovoltage shifts caused by reverse-injecting emitted electrons back into the photocathode.
Uchiyama , author Y
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Electron escape probability in high-efficiency photocathodes measured by reverse-injection photovoltage
Electron escape probability in NEA photocathodes is read out directly from surface-photovoltage shifts caused by reverse-injecting emitted electrons back into the photocathode.