Sequential tilting with full diffraction pattern acquisition improves momentum-resolved STEM field mapping by enabling tilt dependent calibration, quality checks, and weighted averaging that suppress dynamical diffraction effects.
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Sequential tilting 4D-STEM for improved momentum-resolved STEM field mapping
Sequential tilting with full diffraction pattern acquisition improves momentum-resolved STEM field mapping by enabling tilt dependent calibration, quality checks, and weighted averaging that suppress dynamical diffraction effects.