Metric-derived context improves relation-type prediction and data-property assignment for ontology extension on CertGraph, but degrades parent-class prediction.
VeeAlign: Multifaceted Context Representation using Dual Attention for Ontology Alignment
1 Pith paper cite this work. Polarity classification is still indexing.
abstract
Ontology Alignment is an important research problem applied to various fields such as data integration, data transfer, data preparation, etc. State-of-the-art (SOTA) Ontology Alignment systems typically use naive domain-dependent approaches with handcrafted rules or domain-specific architectures, making them unscalable and inefficient. In this work, we propose VeeAlign, a Deep Learning based model that uses a novel dual-attention mechanism to compute the contextualized representation of a concept which, in turn, is used to discover alignments. By doing this, not only is our approach able to exploit both syntactic and semantic information encoded in ontologies, it is also, by design, flexible and scalable to different domains with minimal effort. We evaluate our model on four different datasets from different domains and languages, and establish its superiority through these results as well as detailed ablation studies. The code and datasets used are available at https://github.com/Remorax/VeeAlign.
fields
cs.AI 1years
2026 1verdicts
CONDITIONAL 1representative citing papers
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COntExt: Towards Context-Aware Ontology Extension from Operational Metrics
Metric-derived context improves relation-type prediction and data-property assignment for ontology extension on CertGraph, but degrades parent-class prediction.