Phase amplification microscopy uses a resonant thin-film cavity to amplify weak phase signals from graphene, reaching picometer-level thickness precision and measuring a 0.71 A interlayer spacing difference in twisted bilayer graphene.
Title resolution pending
1 Pith paper cite this work. Polarity classification is still indexing.
1
Pith paper citing it
fields
physics.optics 1years
2025 1verdicts
CONDITIONAL 1representative citing papers
citing papers explorer
-
Phase amplification microscopy towards femtometer accuracy
Phase amplification microscopy uses a resonant thin-film cavity to amplify weak phase signals from graphene, reaching picometer-level thickness precision and measuring a 0.71 A interlayer spacing difference in twisted bilayer graphene.