A high-sensitivity polarimeter maps birefringence in silicon wafers, finding position-dependent values near 10^-7 in (100) samples and -1.5x10^-6 for the (110) orientation at 1550 nm.
Title resolution pending
1 Pith paper cite this work, alongside 11 external citations. Polarity classification is still indexing.
1
Pith paper citing it
11
external citations · OpenAlex
citation-role summary
background 1
citation-polarity summary
fields
physics.optics 1years
2025 1verdicts
CONDITIONAL 1roles
background 1polarities
unclear 1representative citing papers
citing papers explorer
-
Apparatus for the measurement of birefringence maps of optical materials: the case of crystalline silicon for Einstein Telescope
A high-sensitivity polarimeter maps birefringence in silicon wafers, finding position-dependent values near 10^-7 in (100) samples and -1.5x10^-6 for the (110) orientation at 1550 nm.