A measurement platform at 300-400 GHz yields the SLI-EPLD reflection model with sub-band parameterization and WF-TREND fitting that outperforms prior models on tested materials.
300 GHz dual-band channel measurement, analysis and modeling in L-shaped scenarios
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A Measurement-Based Parameterization of Physics Reflection Models for Terahertz Communication
A measurement platform at 300-400 GHz yields the SLI-EPLD reflection model with sub-band parameterization and WF-TREND fitting that outperforms prior models on tested materials.