Simulations show that laser beams shaped into quartic and inverse quartic intensity profiles can cancel spherical aberration in ultrafast electron microscopes over an 8.1 mrad aperture angle.
Ultrafast transmission electron microscopy: historical development, instrumentation, and applications,
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Design for light-based spherical aberration correction of ultrafast electron microscopes
Simulations show that laser beams shaped into quartic and inverse quartic intensity profiles can cancel spherical aberration in ultrafast electron microscopes over an 8.1 mrad aperture angle.