SAM-generated masks train a panoptic segmentation model that counts banana defects exactly in 36.2% of images and estimates relative defect size with r=0.96, at roughly one-tenth the annotation cost.
Schwing, and Alexander Kirillov
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Weakly Supervised Panoptic Segmentation for Defect-Based Grading of Fresh Produce
SAM-generated masks train a panoptic segmentation model that counts banana defects exactly in 36.2% of images and estimates relative defect size with r=0.96, at roughly one-tenth the annotation cost.