Ultrahigh-resolution X-ray Thomson scattering data on single-crystal silicon reveal strong orientation dependence of the inelastic spectrum, reproduced by TDDFT only after fitting the unknown crystal rotation angle.
Dynamic structure factor and dielectric function of silicon for finite momentum transfer: Inelastic x-ray scattering experiments and ab initio calculations
1 Pith paper cite this work. Polarity classification is still indexing.
1
Pith paper citing it
citation-role summary
background 1
citation-polarity summary
fields
cond-mat.mtrl-sci 1years
2025 1verdicts
CONDITIONAL 1roles
background 1polarities
unclear 1representative citing papers
citing papers explorer
-
Strong geometry dependence of the X-ray Thomson Scattering Spectrum in single crystal silicon
Ultrahigh-resolution X-ray Thomson scattering data on single-crystal silicon reveal strong orientation dependence of the inelastic spectrum, reproduced by TDDFT only after fitting the unknown crystal rotation angle.