Shot noise sets a ~10 mV fundamental limit on single ion-channel voltage sensing while Johnson-Nyquist noise bounds collective information at observed channel densities.
We consider a sensor composed of two plates, one with charge Q and another of charge −Q
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Thermal fluctuations set fundamental limits on ion channel function
Shot noise sets a ~10 mV fundamental limit on single ion-channel voltage sensing while Johnson-Nyquist noise bounds collective information at observed channel densities.