Step-scan interferometry with image registration improves spatial fidelity in hyperspectral nano-FTIR by mitigating thermal instability artifacts.
Enhanced dielectric contrast in scattering- type scanning near- field optical microscopy
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Step-scan interferometry for high-fidelity hyperspectral nanoscopy
Step-scan interferometry with image registration improves spatial fidelity in hyperspectral nano-FTIR by mitigating thermal instability artifacts.