Sub-micron resolution (340 nm beamwidth) achieved in large-working-distance pinhole scanning helium microscopy through constrained optimization of atom optics, redesigned pinhole plate, smaller pinhole, increased source distance, and larger detector aperture.
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High resolution large working distance scanning helium microscopy
Sub-micron resolution (340 nm beamwidth) achieved in large-working-distance pinhole scanning helium microscopy through constrained optimization of atom optics, redesigned pinhole plate, smaller pinhole, increased source distance, and larger detector aperture.