A fabrication technique for Josephson junctions using 3D patterned low-loss substrate enables high-quality trilayer junctions from various materials without organic contaminants or intentional oxides.
Potts , author P
2 Pith papers cite this work. Polarity classification is still indexing.
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2026 2verdicts
UNVERDICTED 2representative citing papers
Model-based statistical analysis identifies Al film thickness fluctuations as the dominant source of critical current variation in Al/AlOx/Al Josephson junctions, with 30-degree deposition improving uniformity to 1.2% RSD over 9.75 mm.
citing papers explorer
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Substrate insulated Josephson junctions for superconducting quantum circuits
A fabrication technique for Josephson junctions using 3D patterned low-loss substrate enables high-quality trilayer junctions from various materials without organic contaminants or intentional oxides.
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Geometric dependence of critical-current variation in Al/AlO${\rm _x}$/Al Josephson junctions: a model-based analysis
Model-based statistical analysis identifies Al film thickness fluctuations as the dominant source of critical current variation in Al/AlOx/Al Josephson junctions, with 30-degree deposition improving uniformity to 1.2% RSD over 9.75 mm.