A new combined ACPA-DMFT method is used to show that off-diagonal (hopping) disorder in the Anderson-Hubbard model shifts metal-insulator boundaries and produces a reentrant insulating-metal-insulating sequence as U increases.
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Auxiliary dynamical mean-field approach for Anderson-Hubbard model with off-diagonal disorder
A new combined ACPA-DMFT method is used to show that off-diagonal (hopping) disorder in the Anderson-Hubbard model shifts metal-insulator boundaries and produces a reentrant insulating-metal-insulating sequence as U increases.