The one cut-point phase-type distribution models lifetime data with two piecewise-constant Markov regimes and, on four RRAM datasets, fits better than a standard phase-type model with fewer phases.
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One cut-point phase-type distributions in Reliability. An application to Resistive Random Access Memories
The one cut-point phase-type distribution models lifetime data with two piecewise-constant Markov regimes and, on four RRAM datasets, fits better than a standard phase-type model with fewer phases.