Convolutional neural networks are shown to perform inverse design of thin-film metamaterial stacks by learning the mapping from structure to ellipsometric and reflectance/transmittance spectra, with efficiency gains over traditional optimization as layer count increases.
Simultaneous inverse design continuous and discrete parameters of nanophotonic structures via back-propagation inverse neural network
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General Inverse Design of Thin-Film Metamaterials With Convolutional Neural Networks
Convolutional neural networks are shown to perform inverse design of thin-film metamaterial stacks by learning the mapping from structure to ellipsometric and reflectance/transmittance spectra, with efficiency gains over traditional optimization as layer count increases.