The frequency shifts of cooled silicon nitride microcantilevers exposed to ultra-high-purity gas pulses come primarily from physisorption of trace moisture (about 18 ppm in helium and 9 ppm in argon), not from the target gas.
Estimation of Diffusion Coefficients for Gases and Vapors,
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Physisorption on Nanomechanical Resonators: The Overlooked Influence of Trace Moisture
The frequency shifts of cooled silicon nitride microcantilevers exposed to ultra-high-purity gas pulses come primarily from physisorption of trace moisture (about 18 ppm in helium and 9 ppm in argon), not from the target gas.