Tuning the ratio of X-to-Z syndrome-extraction rounds in defect-adapted surface codes, based on noise bias, reduces logical error rate by up to 8.46x in simulations.
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X-Z Round Scheduling for the Surface Code with Defects under Biased Noise
Tuning the ratio of X-to-Z syndrome-extraction rounds in defect-adapted surface codes, based on noise bias, reduces logical error rate by up to 8.46x in simulations.