A step-reference cross-correlation seeding method improves PCGe pulse rise-time fits, cutting surface leakage by about 70% and lowering the TEXONO analysis threshold by at least 10 eV_ee.
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Bulk-Surface Event Discrimination in Point Contact Germanium Detectors at Near-Threshold Energies with Shape-Matching Pulse-Shape Methods
A step-reference cross-correlation seeding method improves PCGe pulse rise-time fits, cutting surface leakage by about 70% and lowering the TEXONO analysis threshold by at least 10 eV_ee.