A closed-loop multitask Gaussian-process controller on an atomic force microscope selects both measurement location and protocol, transferring information between tapping-mode and DART roughness across an AlScN wafer.
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Multitask Scanning Probe Microscopy
A closed-loop multitask Gaussian-process controller on an atomic force microscope selects both measurement location and protocol, transferring information between tapping-mode and DART roughness across an AlScN wafer.