Denser high-frequency sampling shifts the "critical frequency" upward in simulated EIS, letting Bayesian equivalent-circuit fits skip most low-frequency points — with gains that shrink as noise rises and depend on circuit structure.
(22) Abaspour, M.; Pattipati, K
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Accelerating Electrochemical Impedance Spectroscopy Measurements by Reducing Reliance on Noisy Low-Frequency Data
Denser high-frequency sampling shifts the "critical frequency" upward in simulated EIS, letting Bayesian equivalent-circuit fits skip most low-frequency points — with gains that shrink as noise rises and depend on circuit structure.