Silica thin films show 6% out-of-plane elastic anisotropy removable by 900°C annealing, measured via Brillouin scattering and confirmed by IR reflectivity, with implications for thermal noise models.
Carlotti, Elastic characterization of transparent and opaque films, multilayers and acoustic resonators by sur- face Brillouin scattering: A review, Applied Sciences 8, 124 (2018)
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Elastic and structural anisotropy in silica thin films for gravitational-wave detectors
Silica thin films show 6% out-of-plane elastic anisotropy removable by 900°C annealing, measured via Brillouin scattering and confirmed by IR reflectivity, with implications for thermal noise models.