PWA-TDTR uses modulation frequency as a depth probe to quantify interfacial thermal conductance, layer thermal conductivity, and heat capacity in systems like ε-Ga2O3/SiC, GaN/Si, and GaN/diamond.
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Thermal Characterization of Buried Interfaces in Multilayer Heterostructures via TDTR with Periodic Waveform Analysis
PWA-TDTR uses modulation frequency as a depth probe to quantify interfacial thermal conductance, layer thermal conductivity, and heat capacity in systems like ε-Ga2O3/SiC, GaN/Si, and GaN/diamond.