Direct flexoelectric charge generation is measured for the first time in a 50 nm HfO2 layer, with the extracted coefficient matching earlier inverse-effect values and a width-dependent effective coefficient consistent with tensor-component interplay.
Piezoelectric Effect during Inhomogeneous Deformation and Acoustic Scattering of Carriers in Crystals,
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Measuring direct flexoelectricity at the nanoscale
Direct flexoelectric charge generation is measured for the first time in a 50 nm HfO2 layer, with the extracted coefficient matching earlier inverse-effect values and a width-dependent effective coefficient consistent with tensor-component interplay.