AFM-IR and sMIM can distinguish Bernal, rhombohedral, and intermediate stacking orders in multilayer graphene, including under a boron nitride coating.
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Nanoscale infrared and microwave imaging of stacking faults in multilayer graphene
AFM-IR and sMIM can distinguish Bernal, rhombohedral, and intermediate stacking orders in multilayer graphene, including under a boron nitride coating.