An improved empirical scaling for the n=1 error field penetration threshold is derived from a larger set of Ohmic and L-mode conventional tokamak data, yielding better fit quality and lower uncertainty for future device projections.
Anomalies in the applied magnetic fields in DIII-D and their implications for the understanding of stability experiments
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Improved n=1 Empirical Error Field Penetration Threshold Scaling with Ohmic and L-Mode Conventional Tokamak Plasma Discharges
An improved empirical scaling for the n=1 error field penetration threshold is derived from a larger set of Ohmic and L-mode conventional tokamak data, yielding better fit quality and lower uncertainty for future device projections.