RSCF decouples low-rank systematic residuals from noise via subspace constraints to enable high-fidelity phase and amplitude recovery in Fourier ptychographic microscopy under aberrations and misalignments.
Under-sampling reconstruction with total variational optimization for fourier ptychographic microscopy,
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A Residual-Subspace Constraint Framework for Fourier Ptychographic Microscopy
RSCF decouples low-rank systematic residuals from noise via subspace constraints to enable high-fidelity phase and amplitude recovery in Fourier ptychographic microscopy under aberrations and misalignments.